ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,104, issued on April 7, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Image processing device" was invented by Daiki Nakagawa ... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,105, issued on April 7, was assigned to ADOBE INC. (San Jose, Calif.). "Semantic-aware auto white balance" was invented by Xin Lu (Saratoga... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,106, issued on April 7, was assigned to BOE Technology Group Co. Ltd. (Beijing). "Method and apparatus for identifying defect grade of bad ... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,107, issued on April 7, was assigned to Honeywell Federal Manufacturing & Technologies LLC (Kansas City, Mo.). "Fluorescent security glass"... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,108, issued on April 7, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas). "Method and apparatus to perform a wireline cabl... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,109, issued on April 7, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas). "Systems and methods for generating three-dimens... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,110, issued on April 7, was assigned to Momenta (Suzhou) Technology Co. Ltd. (Suzhou City, China). "Image recognition method, apparatus and... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,111, issued on April 7, was assigned to US Synthetic Corp. (Orem, Utah) and Exo-Field Engineering Solutions PVT Ltd. (Maharashtra, India). ... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,112, issued on April 7, was assigned to NEC Corp. (Tokyo). "Inspection device, inspection method, and recording medium" was invented by Shi... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,113, issued on April 7, was assigned to Hangzhou Dianzi University (Hangzhou City, China). "Fabric defect detection method" was invented by... Read More